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XRD |
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The laboratory is equipped with two powder diffractometers: Thermo-ARL X’TRA and Scintag model XDS 1000. The Thermo-ARL diffractometer is equipped with a heating stage as well as an Anton-Paar in-situ reaction chamber.
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The Micromeritics ASAP 2010 system is equipped with an optional molecular diffusion pump, a chemisortion system, and a density functional theory (DFT) software package. It can be used to measure surface area, pore volume, mesopore and micropore size distribution, adsorbate-adsorbent interaction energy (physisorption ), and dispersion and partricle size of supported metals (chemisorption). |
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Auger spectra are acquired using a Physical Electronics PHI 610 Scanning Auger Microprobe. Auger depth profile spectra can be acquired while sputtering the specimen with Ar+ ions.
The laboratory uses XPS to study various materials and coatings. Photoemission (XPS) data are aquired using a Leybold-Heraeus LHS modified with a SPECS EA 10MCD energy analyzer. The instrument is equipped with a dual X-ray anode for exciting photoemmision with either Mg K a or Al K a radiation.
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Near IR and far IR also can be used from the same instrument. IR Spectroscopy can detect inorganic compounds containing polyatomic ions and metal oxide. The band positions, shape and peak intensity decide the characteristics of functional groups. Both the mull method and KBr pellet are possible to use. |
A Fourier transform infrared (FTIR) spectrophotometer is composed of an IR light source, a sample chamber, a prism to separate light by wavelength, a detector, and a recorder (compute). FTIR spectroscopy can be performed on a Nicolet 750 spectrometer with MCT or DTGS detector and KBr beam splitter for the mid-IR. Spectra can be collected with various resolutions by using scans. The sample chamber is purged by N2 during the measurements.
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An Amray model 1810 scanning electron microscope is located inside the facility. The microscope shows surface images up to several thousand times magnification. An additional feature is the ability to determine elemental composition with the attached EDAX apparatus.
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AFM / STM
Our SPM is a MultiMode scanning probe microscope. The MM-SPM is designed around a stationary probe (i.e. samples are scanned back and forth beneath the probe). It uses Nanoscope version 4.x. Digital Instruments software that has divided its SPM software into a two-function architecture: Real Time and Off-line. |
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The MultiMode-SPM can scan up to 200 mm laterally and 10 mm vertically. The MM-SPM is a multi mode instrument that includes Atomic Force Microscopy (AFM): contact, tapping-mode, and non-contact; Phase-Imaging; Magnetic Force Microscope (MFM); Electric Force Microscope (EFM); Surface Potential Microscopy; LiftMode; Force Modulation; Lateral Force Microscopy (LFM); Scanning Tunneling Microscopy (STM); Electrochemical Microscopy (ECSTM and ECAFM); and Lithography.
The MultiMode utilizes a Nanoscope IIIa Controller having a digital signal processor (DSP) with a 20 MHz peak rate for arithmetic operations. The MM-SPM is equipped with four auxiliary digital-to-analog converters (DACs). Three DACs have +10V outputs, and one DAC has a +12V and +220V outputs; all four channels have 16-bit resolution. In addition, there are two +10V analog-to-digital converters (ADCs) having 14-bit resolution and software selectable filters. One ADC has four-way multiplexing.
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Thermal analysis of solids, liquid and powder samples can be carried out using the Dupont 951 Thermogravimetric Analyzer (TGA) and Dupont 910 Differential Scanning Calorimeter (DSC). These instruments are equipped with a Temperature Programmer Interface (TPI) TA Controller System. TGA can be used to measure the weight chanege of a sample with temperature while DSC measures temperature and heat flow associated with material transition providing data on endothermic (heat absorption) and exothermic (heat evolution) processes.
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SDT is capable of performing both differential scanning calorimetry (DSC) and thermogravimetic analysis (TGA) at the same time. Temperature ranges from room temperature to 1500 °C. The computer enables to have an interface to analyze data, set up experiments and enter constants, store data and run data analysis programs.
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Microwaves are very efficient at heating many materials and removing water or other liquids from products. This technique allows researchers to obtain materials with unique characteristics in very short times. Our group is equiped with different microwaves ovens.
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(c) (d)  (e)
(a) Microwave oven Model 10-1300 (0-1300 W, 2.45 GHz) (b) Microwave power source Model GL139 Astex (0-1250 W, 2 .45GHz) (c) Wavemat Model CMPR TM250 (0-1250 W, 2.45 GHz) (d) Variable Frequency Microwave Furnace Model LT 502Xb (0-500 W, 2.4-7.0 GHz) (e) CEM MARS 5 Microwave - Accelerated Reaction System (400/800/1600 W, 2.45 GHz) |
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| Mass Spectrometer System is a mobile vacuum pumping station designed to be used in conjunction with a Type PPT Residual Gas Analyzer. The PPT (Partial Pressure Transducer) utilizes Quadrupole Mass Analyzer technology. Quadropole Mass Spectrometry is an efficient method of process gas analysis. PPT quadrupole sensor allows detection of distinct constituents in the gas environment. The Electronic Control Unit, interactive software, and quadrupole sensor combine to provide the speed, resolution, and sensitivity required for partial pressure sensing. |
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CVD
The ceramics laboratory is fully equipped with a large amount of hood space dedicated to sol-gel synthesis and CVD research. This facility utilizes both CVD and sol-gel methods for various coating applications. The furnaces used in the CVD applications range dramatically in size from the small 1 inch diameter furnaces used in test reactions to the large 6 inch diameter furnaces used in scale-up processes. Coatings such as alumina (CVD and sol-gel), carbon, and boron nitride have been deposited on substrates including silicon carbide fibers, metal sheets, and silicon powder.
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